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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/SaposhnikovDGS96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexej_Dmitriev>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_G%E2%88%9A%E2%88%82ssel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Valerij_V._Saposhnikov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vladimir_V._Saposhnikov>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510852>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510852>
dc:identifier DBLP conf/vts/SaposhnikovDGS96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510852 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Self-dual parity checking-A new method for on-line testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexej_Dmitriev>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_G%E2%88%9A%E2%88%82ssel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Valerij_V._Saposhnikov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vladimir_V._Saposhnikov>
swrc:pages 162-168 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/SaposhnikovDGS96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/SaposhnikovDGS96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#SaposhnikovDGS96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510852>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Boolean functions; logic testing; automatic testing; integrated circuit testing; VLSI; integrated logic circuits; self-dual parity checking; online testing; self-dual complement; Boolean function; error checking; fault coverage (xsd:string)
dc:title Self-dual parity checking-A new method for on-line testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document