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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/SebaaGNV95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lahouari_Sebaa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Norm_Gardner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rich_Valley>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_Neidorff>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512619>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512619>
dc:identifier DBLP conf/vts/SebaaGNV95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512619 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Self-test in a VCM driver chip. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lahouari_Sebaa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Norm_Gardner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rich_Valley>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_Neidorff>
swrc:pages 66-73 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/SebaaGNV95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/SebaaGNV95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#SebaaGNV95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512619>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject driver circuits; bridge circuits; built-in self test; integrated circuit testing; design for testability; mixed analogue-digital integrated circuits; instrumentation amplifiers; digital-analogue conversion; pulse amplifiers; VCM driver chip; self-test mode; complex mixed-signal device; device under test; voice-coil motor; H-bridge amplifier; onchip D/A converter; self-test circuitry; 11 bit (xsd:string)
dc:title Self-test in a VCM driver chip. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document