LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/SekarD02
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/vts/SekarD02
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Krishna_Sekar
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sujit_Dey
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FVTS.2002.1011174
>
foaf:
homepage
<
https://doi.org/10.1109/VTS.2002.1011174
>
dc:
identifier
DBLP conf/vts/SekarD02
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FVTS.2002.1011174
(xsd:string)
dcterms:
issued
2002
(xsd:gYear)
rdfs:
label
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Krishna_Sekar
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sujit_Dey
>
swrc:
pages
417-422
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/vts/2002
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/vts/SekarD02/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/vts/SekarD02
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/vts/vts2002.html#SekarD02
>
rdfs:
seeAlso
<
https://doi.org/10.1109/VTS.2002.1011174
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/vts
>
dc:
title
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document