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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/SenguttuvanBC08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajarajan_Senguttuvan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Soumendu_Bhattacharya>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2008.24>
foaf:homepage <https://doi.org/10.1109/VTS.2008.24>
dc:identifier DBLP conf/vts/SenguttuvanBC08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2008.24 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rajarajan_Senguttuvan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Soumendu_Bhattacharya>
swrc:pages 175-180 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/SenguttuvanBC08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/SenguttuvanBC08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2008.html#SenguttuvanBC08>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2008.24>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject manufacturing testing, test time, communication systems (xsd:string)
dc:title Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document