[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ShaikB95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Imtiaz_P._Shaik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512666>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512666>
dc:identifier DBLP conf/vts/ShaikB95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512666 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Circuit design for low overhead delay-fault BIST using constrained quadratic 0-1 programming . (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Imtiaz_P._Shaik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
swrc:pages 393-399 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/ShaikB95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/ShaikB95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#ShaikB95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512666>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject built-in self test; delays; automatic testing; integrated circuit testing; hazards and race conditions; quadratic programming; VLSI; integrated circuit design; logic design; logic testing; digital integrated circuits; circuit design; low overhead delay-fault BIST; constrained quadratic 0-1 programming; built-in self testing model; weighted signed graph balancing problem (xsd:string)
dc:title Circuit design for low overhead delay-fault BIST using constrained quadratic 0-1 programming . (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document