A diagnosability metric for parametric path delay faults. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/vts/SivaramanS96>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Andrzej_J._Strojwas>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Mukund_Sivaraman>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510874>
foaf:homepage	<https://doi.org/10.1109/VTEST.1996.510874>
dc:identifier	DBLP conf/vts/SivaramanS96 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FVTEST.1996.510874 (xsd:string)
dcterms:issued	1996 (xsd:gYear)
rdfs:label	A diagnosability metric for parametric path delay faults. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Andrzej_J._Strojwas>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Mukund_Sivaraman>
swrc:pages	316-323 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/vts/SivaramanS96/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/vts/SivaramanS96>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/vts/vts1996.html#SivaramanS96>
rdfs:seeAlso	<https://doi.org/10.1109/VTEST.1996.510874>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject	delays; fault diagnosis; logic testing; integrated circuit testing; failure analysis; VLSI; timing; diagnosability metric; parametric path delay faults; delay fault testing; test vector pairs; chip failure; fabrication process parameter variations; diagnosability; diagnosis framework; test set; ISCAS'89 benchmark circuits (xsd:string)
dc:title	A diagnosability metric for parametric path delay faults. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
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