Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!).
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/StroudKCA96
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/vts/StroudKCA96
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Charles_E._Stroud
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Miron_Abramovici
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ping_Chen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Srinivasa_Konala
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510883
>
foaf:
homepage
<
https://doi.org/10.1109/VTEST.1996.510883
>
dc:
identifier
DBLP conf/vts/StroudKCA96
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FVTEST.1996.510883
(xsd:string)
dcterms:
issued
1996
(xsd:gYear)
rdfs:
label
Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!).
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Charles_E._Stroud
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Miron_Abramovici
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ping_Chen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Srinivasa_Konala
>
swrc:
pages
387-392
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/vts/StroudKCA96/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/vts/StroudKCA96
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/vts/vts1996.html#StroudKCA96
>
rdfs:
seeAlso
<
https://doi.org/10.1109/VTEST.1996.510883
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/vts
>
dc:
subject
built-in self test; field programmable gate arrays; logic testing; integrated circuit testing; VLSI; automatic testing; built-in self-test; FPGA testing; field programmable gate array testing; BIST architecture; programmable logic blocks
(xsd:string)
dc:
title
Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!).
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document