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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/TiwariSWRP08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijeet_Shrivastava>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahit_Warhadpande>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajesh_Tiwari>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rubin_A._Parekhji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srivaths_Ravi_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2008.62>
foaf:homepage <https://doi.org/10.1109/VTS.2008.62>
dc:identifier DBLP conf/vts/TiwariSWRP08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2008.62 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijeet_Shrivastava>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahit_Warhadpande>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rajesh_Tiwari>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rubin_A._Parekhji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srivaths_Ravi_0001>
swrc:pages 53-58 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/TiwariSWRP08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/TiwariSWRP08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2008.html#TiwariSWRP08>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2008.62>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Test Data Volume, Test Time, ATPG, ATE, Tester, Estimation (xsd:string)
dc:title A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document