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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ToubaM96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510828>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510828>
dc:identifier DBLP conf/vts/ToubaM96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510828 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Test point insertion based on path tracing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
swrc:pages 2-8 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/ToubaM96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/ToubaM96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#ToubaM96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510828>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject VLSI; fault diagnosis; logic testing; integrated circuit testing; probability; built-in self test; timing; automatic testing; test point insertion; path tracing; circuit-under-test; fault coverage; probabilistic techniques; primary inputs; insertion methods; BIST; logic testing; VLSI (xsd:string)
dc:title Test point insertion based on path tracing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document