[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ToubaM96a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510884>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510884>
dc:identifier DBLP conf/vts/ToubaM96a (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510884 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Applying two-pattern tests using scan-mapping. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba>
swrc:pages 393-399 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/ToubaM96a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/ToubaM96a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#ToubaM96a>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510884>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject logic testing; built-in self test; two-pattern tests; scan-mapping; combinational mapping logic; built-in self-testing; fault coverage; delay faults; deterministic testing; pseudo-random testing (xsd:string)
dc:title Applying two-pattern tests using scan-mapping. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document