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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/TsengHL10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Sheng_Hou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsu-Wei_Tseng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2010.5469627>
foaf:homepage <https://doi.org/10.1109/VTS.2010.5469627>
dc:identifier DBLP conf/vts/TsengHL10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2010.5469627 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Automatic generation of memory built-in self-repair circuits in SOCs for minimizing test time and area cost. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Sheng_Hou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsu-Wei_Tseng>
swrc:pages 21-26 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/TsengHL10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/TsengHL10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2010.html#TsengHL10>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2010.5469627>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Automatic generation of memory built-in self-repair circuits in SOCs for minimizing test time and area cost. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document