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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/Valdes-GarciaSS04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alberto_Valdes-Garcia>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edgar_S%E2%88%9A%C2%B0nchez-Sinencio>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Silva-Mart%E2%88%9A%E2%89%A0nez>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2004.1299252>
foaf:homepage <https://doi.org/10.1109/VTEST.2004.1299252>
dc:identifier DBLP conf/vts/Valdes-GarciaSS04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2004.1299252 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label An On-Chip Transfer Function Characterization System for Analog Built-in Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alberto_Valdes-Garcia>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edgar_S%E2%88%9A%C2%B0nchez-Sinencio>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Silva-Mart%E2%88%9A%E2%89%A0nez>
swrc:pages 261-266 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/Valdes-GarciaSS04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/Valdes-GarciaSS04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2004.html#Valdes-GarciaSS04>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2004.1299252>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title An On-Chip Transfer Function Characterization System for Analog Built-in Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document