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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/VazquezHLRH02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adoraci%E2%88%9A%E2%89%A5n_Rueda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Diego_V%E2%88%9A%C2%B0zquez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gildas_L%E2%88%9A%C2%A9ger>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gloria_Huertas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_L._Huertas>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2002.1011176>
foaf:homepage <https://doi.org/10.1109/VTS.2002.1011176>
dc:identifier DBLP conf/vts/VazquezHLRH02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2002.1011176 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adoraci%E2%88%9A%E2%89%A5n_Rueda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Diego_V%E2%88%9A%C2%B0zquez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gildas_L%E2%88%9A%C2%A9ger>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gloria_Huertas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_L._Huertas>
swrc:pages 433-438 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/VTS.2002.1011176>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject On-chip Evaluation, BIST, Oscillation-Based-Test, Analog Testing (xsd:string)
dc:title Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document