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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/VerhaegenPG97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Geert_Van_der_Plas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Georges_G._E._Gielen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wim_Verhaegen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1997.600291>
foaf:homepage <https://doi.org/10.1109/VTEST.1997.600291>
dc:identifier DBLP conf/vts/VerhaegenPG97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1997.600291 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label Automated test pattern generation for analog integrated circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Geert_Van_der_Plas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Georges_G._E._Gielen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wim_Verhaegen>
swrc:pages 296-301 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/VerhaegenPG97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/VerhaegenPG97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1997.html#VerhaegenPG97>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1997.600291>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject analogue integrated circuits; automated test pattern generation; analog integrated circuits; generated fault list; optimal test signals; statistical fluctuations; statistical test criterion; ATPG algorithm (xsd:string)
dc:title Automated test pattern generation for analog integrated circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document