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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/WangMKW95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li-C._Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Ray_Mercer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sophia_W._Kao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_W._Williams>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512620>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512620>
dc:identifier DBLP conf/vts/WangMKW95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512620 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label On the decline of testing efficiency as fault coverage approaches 100%. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li-C._Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Ray_Mercer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sophia_W._Kao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_W._Williams>
swrc:pages 74-83 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/WangMKW95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/WangMKW95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#WangMKW95>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512620>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject fault diagnosis; logic testing; automatic testing; integrated circuit testing; production testing; testing efficiency; fault coverage; manufacturing process; single stuck-at fault model; test quality; circuit sizes; ISCAS benchmark circuits; nontarget defects; test pattern generation (xsd:string)
dc:title On the decline of testing efficiency as fault coverage approaches 100%. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document