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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/WangYCIZ04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baosheng_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_Cicalo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Josh_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yervant_Zorian>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2004.1299249>
foaf:homepage <https://doi.org/10.1109/VTEST.2004.1299249>
dc:identifier DBLP conf/vts/WangYCIZ04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2004.1299249 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Reducing Embedded SRAM Test Time under Redundancy Constraints. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baosheng_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_Cicalo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Josh_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yervant_Zorian>
swrc:pages 237-242 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/WangYCIZ04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/WangYCIZ04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2004.html#WangYCIZ04>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2004.1299249>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Embedded SRAMs, March Tests, Memory testing, Memory Test Time, Memory Redundancy (xsd:string)
dc:title Reducing Embedded SRAM Test Time under Redundancy Constraints. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document