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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/WelchMKJ91>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donald_S._Kent>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donald_W._Joseph>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_A._Monzel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kyle_G._Welch>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1991.208167>
foaf:homepage <https://doi.org/10.1109/VTEST.1991.208167>
dc:identifier DBLP conf/vts/WelchMKJ91 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1991.208167 (xsd:string)
dcterms:issued 1991 (xsd:gYear)
rdfs:label Delay testing and failure analysis of ECL logic with embedded memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donald_S._Kent>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donald_W._Joseph>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_A._Monzel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kyle_G._Welch>
swrc:pages 254-259 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1991>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/WelchMKJ91/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/WelchMKJ91>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1991.html#WelchMKJ91>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1991.208167>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Delay testing and failure analysis of ECL logic with embedded memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document