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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/YuHA03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hak-soo_Yu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacob_A._Abraham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sungbae_Hwang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2003.1197637>
foaf:homepage <https://doi.org/10.1109/VTEST.2003.1197637>
dc:identifier DBLP conf/vts/YuHA03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2003.1197637 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label DSP-Based Statistical Self Test of On-Chip Converters. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hak-soo_Yu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacob_A._Abraham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sungbae_Hwang>
swrc:pages 83-88 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/YuHA03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/YuHA03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2003.html#YuHA03>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2003.1197637>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title DSP-Based Statistical Self Test of On-Chip Converters. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document