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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ZhengBA96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ashok_Balivada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong_Helena_Zheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacob_A._Abraham>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510895>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510895>
dc:identifier DBLP conf/vts/ZhengBA96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510895 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label A novel test generation approach for parametric faults in linear analog circuits . (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ashok_Balivada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong_Helena_Zheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacob_A._Abraham>
swrc:pages 470-475 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/ZhengBA96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/ZhengBA96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#ZhengBA96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510895>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject analogue integrated circuits; integrated circuit testing; fault location; VLSI; time-domain analysis; equivalent circuits; analogue processing circuits; test generation; parametric faults; linear analog circuits; digital test software; time-domain tests; equivalent digital circuit; stuck-at faults; digital test vectors; test waveform (xsd:string)
dc:title A novel test generation approach for parametric faults in linear analog circuits . (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document