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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ZhengYLWCKRR22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen_Wang_0014>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Yu_Yeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mark_Kassab>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shi-Xuan_Zheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wu-Tung_Cheng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS52500.2021.9794207>
foaf:homepage <https://doi.org/10.1109/VTS52500.2021.9794207>
dc:identifier DBLP conf/vts/ZhengYLWCKRR22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS52500.2021.9794207 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen_Wang_0014>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Yu_Yeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janusz_Rajski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mark_Kassab>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shi-Xuan_Zheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wu-Tung_Cheng>
swrc:pages 1-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/ZhengYLWCKRR22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/ZhengYLWCKRR22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts20222.html#ZhengYLWCKRR22>
rdfs:seeAlso <https://doi.org/10.1109/VTS52500.2021.9794207>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document