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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ZhouGLA22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peng_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ujjwal_Guin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ziqi_Zhou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS52500.2021.9794254>
foaf:homepage <https://doi.org/10.1109/VTS52500.2021.9794254>
dc:identifier DBLP conf/vts/ZhouGLA22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS52500.2021.9794254 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peng_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ujjwal_Guin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ziqi_Zhou>
swrc:pages 1-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/ZhouGLA22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/ZhouGLA22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts20222.html#ZhouGLA22>
rdfs:seeAlso <https://doi.org/10.1109/VTS52500.2021.9794254>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document