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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/wcre/HuangCST23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dave_Towey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haibo_Chen_0005>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rubing_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weifeng_Sun>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSANER56733.2023.00102>
foaf:homepage <https://doi.org/10.1109/SANER56733.2023.00102>
dc:identifier DBLP conf/wcre/HuangCST23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSANER56733.2023.00102 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Extended Abstract of Candidate Test Set Reduction for Adaptive Random Testing: An Overheads Reduction Technique. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dave_Towey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haibo_Chen_0005>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rubing_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weifeng_Sun>
swrc:pages 853-854 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/wcre/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/wcre/HuangCST23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/wcre/HuangCST23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/wcre/saner2023.html#HuangCST23>
rdfs:seeAlso <https://doi.org/10.1109/SANER56733.2023.00102>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/wcre>
dc:title Extended Abstract of Candidate Test Set Reduction for Adaptive Random Testing: An Overheads Reduction Technique. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document