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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/wsc/EhmJFLN18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anh_Nguyen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frederic_Jankowiak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_Ehm>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tim_Lauer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Veronika_Filser>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FWSC.2018.8632431>
foaf:homepage <https://doi.org/10.1109/WSC.2018.8632431>
dc:identifier DBLP conf/wsc/EhmJFLN18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FWSC.2018.8632431 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label A Generic VMI Measurement and Application in the semiconductor Industry. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anh_Nguyen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frederic_Jankowiak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_Ehm>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tim_Lauer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Veronika_Filser>
swrc:pages 3449-3460 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/wsc/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/wsc/EhmJFLN18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/wsc/EhmJFLN18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/wsc/wsc2018.html#EhmJFLN18>
rdfs:seeAlso <https://doi.org/10.1109/WSC.2018.8632431>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/wsc>
dc:title A Generic VMI Measurement and Application in the semiconductor Industry. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document