[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/wsc/QiTS02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Appa_Iyer_Sivakumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chao_Qi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tuck_Keat_Tang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FWSC.2002.1166413>
foaf:homepage <https://doi.org/10.1109/WSC.2002.1166413>
dc:identifier DBLP conf/wsc/QiTS02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FWSC.2002.1166413 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Modeling methodology: simulation based cause and effect analysis of cycle time and WIP in semiconductor wafer fabrication. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Appa_Iyer_Sivakumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chao_Qi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tuck_Keat_Tang>
swrc:pages 1423-1430 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/wsc/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/wsc/QiTS02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/wsc/QiTS02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/wsc/wsc2002.html#QiTS02>
rdfs:seeAlso <https://doi.org/10.1109/WSC.2002.1166413>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/wsc>
dc:title Modeling methodology: simulation based cause and effect analysis of cycle time and WIP in semiconductor wafer fabrication. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document