Challenges Associated with Realization of Lot Level Fab Out Forecast in a Giga Wafer Fabrication Plant.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/wsc/SeidelLTLGS20
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Aik_Ying_Tang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Boon_Ping_Gan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ching_Foong_Lee
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Georg_Seidel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Soo_Leen_Low
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Scholl
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FWSC48552.2020.9384046
>
foaf:
homepage
<
https://doi.org/10.1109/WSC48552.2020.9384046
>
dc:
identifier
DBLP conf/wsc/SeidelLTLGS20
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FWSC48552.2020.9384046
(xsd:string)
dcterms:
issued
2020
(xsd:gYear)
rdfs:
label
Challenges Associated with Realization of Lot Level Fab Out Forecast in a Giga Wafer Fabrication Plant.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Aik_Ying_Tang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Boon_Ping_Gan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ching_Foong_Lee
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Georg_Seidel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Soo_Leen_Low
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Scholl
>
swrc:
pages
1777-1788
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/wsc/2020
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/wsc/SeidelLTLGS20/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/wsc/SeidelLTLGS20
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/wsc/wsc2020.html#SeidelLTLGS20
>
rdfs:
seeAlso
<
https://doi.org/10.1109/WSC48552.2020.9384046
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/wsc
>
dc:
title
Challenges Associated with Realization of Lot Level Fab Out Forecast in a Giga Wafer Fabrication Plant.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document