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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/wsc/SivakumarQH08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andy_Darwin_Kasan_Hidayat>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Appa_Iyer_Sivakumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chao_Qi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FWSC.2008.4736299>
foaf:homepage <https://doi.org/10.1109/WSC.2008.4736299>
dc:identifier DBLP conf/wsc/SivakumarQH08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FWSC.2008.4736299 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Experimental study on variations of WIPLOAD Control in semiconductor wafer fabrication environment. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andy_Darwin_Kasan_Hidayat>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Appa_Iyer_Sivakumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chao_Qi>
swrc:pages 2035-2040 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/wsc/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/wsc/SivakumarQH08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/wsc/SivakumarQH08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/wsc/wsc2008.html#SivakumarQH08>
rdfs:seeAlso <https://doi.org/10.1109/WSC.2008.4736299>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/wsc>
dc:title Experimental study on variations of WIPLOAD Control in semiconductor wafer fabrication environment. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document