Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Oleg_Gradov>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/P._A._Nasirov>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.21227%2F9wmx-kb90>
foaf:homepage	<https://doi.org/10.21227/9wmx-kb90>
dc:identifier	DBLP data/10/GradovN18c (xsd:string)
dc:identifier	DOI doi.org%2F10.21227%2F9wmx-kb90 (xsd:string)
dcterms:issued	2018 (xsd:gYear)
rdfs:label	Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Oleg_Gradov>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/P._A._Nasirov>
swrc:month	November (xsd:string)
dc:publisher	IEEE DataPort (xsd:string)
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rdfs:seeAlso	<https://doi.org/10.21227/9wmx-kb90>
dc:title	Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements. (xsd:string)
rdf:type	foaf:Document