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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/access/InabaOAFIKSFM24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Asai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Fuketa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Oka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kimihiko_Kato>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koichi_Fukuda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shota_Iizuka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shunsuke_Shitakata>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takahiro_Mori>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takumi_Inaba>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FACCESS.2024.3355588>
foaf:homepage <https://doi.org/10.1109/ACCESS.2024.3355588>
dc:identifier DBLP journals/access/InabaOAFIKSFM24 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FACCESS.2024.3355588 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/access>
rdfs:label Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Asai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Fuketa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Oka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kimihiko_Kato>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koichi_Fukuda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shota_Iizuka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shunsuke_Shitakata>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takahiro_Mori>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takumi_Inaba>
swrc:pages 12458-12464 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/access/InabaOAFIKSFM24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/access/InabaOAFIKSFM24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/access/access12.html#InabaOAFIKSFM24>
rdfs:seeAlso <https://doi.org/10.1109/ACCESS.2024.3355588>
dc:title Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 12 (xsd:string)