A Novel IC Measurement Without Blanking Time for Short-Circuit Protection of High-Power IPM.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/access/MengYGAFWW20
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A Novel IC Measurement Without Blanking Time for Short-Circuit Protection of High-Power IPM.
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A Novel IC Measurement Without Blanking Time for Short-Circuit Protection of High-Power IPM.
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