Electrical Characterization by Counter-Doped Pocket Design in Tunnel FETs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/access/NamKC23
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Electrical Characterization by Counter-Doped Pocket Design in Tunnel FETs.
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Electrical Characterization by Counter-Doped Pocket Design in Tunnel FETs.
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