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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/access/NamKC23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ki_Ryung_Nam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwang_Soo_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Woo_Young_Choi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FACCESS.2023.3262285>
foaf:homepage <https://doi.org/10.1109/ACCESS.2023.3262285>
dc:identifier DBLP journals/access/NamKC23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FACCESS.2023.3262285 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/access>
rdfs:label Electrical Characterization by Counter-Doped Pocket Design in Tunnel FETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ki_Ryung_Nam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwang_Soo_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Woo_Young_Choi>
swrc:pages 30546-30554 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/access/NamKC23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/access/NamKC23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/access/access11.html#NamKC23>
rdfs:seeAlso <https://doi.org/10.1109/ACCESS.2023.3262285>
dc:title Electrical Characterization by Counter-Doped Pocket Design in Tunnel FETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 11 (xsd:string)