[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/access/ParkKKKYL21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong_Yeong_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Geon_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin_Hyo_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Myoung_Jin_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Su_Yeon_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sunyong_Yoo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FACCESS.2021.3102687>
foaf:homepage <https://doi.org/10.1109/ACCESS.2021.3102687>
dc:identifier DBLP journals/access/ParkKKKYL21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FACCESS.2021.3102687 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/access>
rdfs:label S-TAT Leakage Current in Partial Isolation Type Saddle-FinFET (Pi-FinFET)s. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong_Yeong_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Geon_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jin_Hyo_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Myoung_Jin_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Su_Yeon_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sunyong_Yoo>
swrc:pages 111567-111575 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/access/ParkKKKYL21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/access/ParkKKKYL21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/access/access9.html#ParkKKKYL21>
rdfs:seeAlso <https://doi.org/10.1109/ACCESS.2021.3102687>
dc:title S-TAT Leakage Current in Partial Isolation Type Saddle-FinFET (Pi-FinFET)s. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 9 (xsd:string)