Silicon Proven 1.29 őľm √ó 1.8 őľm 65nm Sub-Vt Optical Sensor for Hardware Security Applications.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/access/ZookerWFK23
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/access/ZookerWFK23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Alexander_Fish
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/David_Zooker
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Osnat_Keren
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yoav_Weizman
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FACCESS.2023.3338001
>
foaf:
homepage
<
https://doi.org/10.1109/ACCESS.2023.3338001
>
dc:
identifier
DBLP journals/access/ZookerWFK23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FACCESS.2023.3338001
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/access
>
rdfs:
label
Silicon Proven 1.29 őľm √ó 1.8 őľm 65nm Sub-Vt Optical Sensor for Hardware Security Applications.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Alexander_Fish
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/David_Zooker
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Osnat_Keren
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yoav_Weizman
>
swrc:
pages
136269-136278
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/access/ZookerWFK23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/access/ZookerWFK23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/access/access11.html#ZookerWFK23
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ACCESS.2023.3338001
>
dc:
title
Silicon Proven 1.29 őľm √ó 1.8 őľm 65nm Sub-Vt Optical Sensor for Hardware Security Applications.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
11
(xsd:string)