Detecting dyeing machine entanglement anomalies by using time series image analysis and deep learning techniques for dyeing-finishing process. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/aei/WangK23>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Chi-Hung_Kuo>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Chien-Chih_Wang>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1016%2Fj.aei.2022.101852>
foaf:homepage	<https://doi.org/10.1016/j.aei.2022.101852>
dc:identifier	DBLP journals/aei/WangK23 (xsd:string)
dc:identifier	DOI doi.org%2F10.1016%2Fj.aei.2022.101852 (xsd:string)
dcterms:issued	2023 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/aei>
rdfs:label	Detecting dyeing machine entanglement anomalies by using time series image analysis and deep learning techniques for dyeing-finishing process. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Chi-Hung_Kuo>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Chien-Chih_Wang>
swrc:month	January (xsd:string)
swrc:pages	101852 (xsd:string)
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/aei/aei55.html#WangK23>
rdfs:seeAlso	<https://doi.org/10.1016/j.aei.2022.101852>
dc:title	Detecting dyeing machine entanglement anomalies by using time series image analysis and deep learning techniques for dyeing-finishing process. (xsd:string)
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