[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/candie/ChienHC13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen-Fu_Chien_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chia-Yu_Hsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuo-Hao_Chang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.cie.2011.11.024>
foaf:homepage <https://doi.org/10.1016/j.cie.2011.11.024>
dc:identifier DBLP journals/candie/ChienHC13 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.cie.2011.11.024 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/candie>
rdfs:label Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen-Fu_Chien_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chia-Yu_Hsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuo-Hao_Chang>
swrc:number 1 (xsd:string)
swrc:pages 117-127 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/candie/ChienHC13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/candie/ChienHC13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/candie/candie65.html#ChienHC13>
rdfs:seeAlso <https://doi.org/10.1016/j.cie.2011.11.024>
dc:title Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 65 (xsd:string)