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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/cce/ReisD12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marco_S._Reis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pedro_Delgado>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.compchemeng.2011.12.008>
foaf:homepage <https://doi.org/10.1016/j.compchemeng.2011.12.008>
dc:identifier DBLP journals/cce/ReisD12 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.compchemeng.2011.12.008 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/cce>
rdfs:label A large-scale statistical process control approach for the monitoring of electronic devices assemblage. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marco_S._Reis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pedro_Delgado>
swrc:pages 163-169 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/cce/ReisD12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/cce/ReisD12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/cce/cce39.html#ReisD12>
rdfs:seeAlso <https://doi.org/10.1016/j.compchemeng.2011.12.008>
dc:title A large-scale statistical process control approach for the monitoring of electronic devices assemblage. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 39 (xsd:string)