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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ce/ChangLC98a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuo-En_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sei-Hua_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sei-Wang_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2FS0360-1315%2898%2900030-X>
foaf:homepage <https://doi.org/10.1016/S0360-1315(98)00030-X>
dc:identifier DBLP journals/ce/ChangLC98a (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2FS0360-1315%2898%2900030-X (xsd:string)
dcterms:issued 1998 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ce>
rdfs:label A testing system for diagnosing misconceptions in DC electric circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuo-En_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sei-Hua_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sei-Wang_Chen>
swrc:number 2 (xsd:string)
swrc:pages 195-210 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ce/ChangLC98a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ce/ChangLC98a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ce/ce31.html#ChangLC98a>
rdfs:seeAlso <https://doi.org/10.1016/S0360-1315(98)00030-X>
dc:title A testing system for diagnosing misconceptions in DC electric circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 31 (xsd:string)