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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/cee/DebGBKS22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Deepjyoti_Deb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kavindra_Kandpal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajesh_Saha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ratul_Kr._Baruah>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rupam_Goswami>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.compeleceng.2022.107930>
foaf:homepage <https://doi.org/10.1016/j.compeleceng.2022.107930>
dc:identifier DBLP journals/cee/DebGBKS22 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.compeleceng.2022.107930 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/cee>
rdfs:label Parametric investigation and trap sensitivity of n-p-n double gate TFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Deepjyoti_Deb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kavindra_Kandpal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rajesh_Saha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ratul_Kr._Baruah>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rupam_Goswami>
swrc:pages 107930 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/cee/DebGBKS22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/cee/DebGBKS22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/cee/cee100.html#DebGBKS22>
rdfs:seeAlso <https://doi.org/10.1016/j.compeleceng.2022.107930>
dc:title Parametric investigation and trap sensitivity of n-p-n double gate TFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 100 (xsd:string)