Parametric investigation and trap sensitivity of n-p-n double gate TFETs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/cee/DebGBKS22
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/cee/DebGBKS22
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Deepjyoti_Deb
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kavindra_Kandpal
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rajesh_Saha
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ratul_Kr._Baruah
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rupam_Goswami
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1016%2Fj.compeleceng.2022.107930
>
foaf:
homepage
<
https://doi.org/10.1016/j.compeleceng.2022.107930
>
dc:
identifier
DBLP journals/cee/DebGBKS22
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1016%2Fj.compeleceng.2022.107930
(xsd:string)
dcterms:
issued
2022
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/cee
>
rdfs:
label
Parametric investigation and trap sensitivity of n-p-n double gate TFETs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Deepjyoti_Deb
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kavindra_Kandpal
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rajesh_Saha
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ratul_Kr._Baruah
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rupam_Goswami
>
swrc:
pages
107930
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/cee/DebGBKS22/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/cee/DebGBKS22
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/cee/cee100.html#DebGBKS22
>
rdfs:
seeAlso
<
https://doi.org/10.1016/j.compeleceng.2022.107930
>
dc:
title
Parametric investigation and trap sensitivity of n-p-n double gate TFETs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
100
(xsd:string)