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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/cem/HoqueSB20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patanjali_SLPSK>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Swarup_Bhunia>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tamzidul_Hoque>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMCE.2020.2988048>
foaf:homepage <https://doi.org/10.1109/MCE.2020.2988048>
dc:identifier DBLP journals/cem/HoqueSB20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMCE.2020.2988048 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/cem>
rdfs:label Trust Issues in Microelectronics: The Concerns and the Countermeasures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patanjali_SLPSK>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Swarup_Bhunia>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tamzidul_Hoque>
swrc:number 6 (xsd:string)
swrc:pages 72-83 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/cem/HoqueSB20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/cem/HoqueSB20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/cem/cem9.html#HoqueSB20>
rdfs:seeAlso <https://doi.org/10.1109/MCE.2020.2988048>
dc:title Trust Issues in Microelectronics: The Concerns and the Countermeasures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 9 (xsd:string)