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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/chinaf/0001YY018>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guihai_Yan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jing_Ye_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaowei_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ying_Wang_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs11432-017-9290-4>
foaf:homepage <https://doi.org/10.1007/s11432-017-9290-4>
dc:identifier DBLP journals/chinaf/0001YY018 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs11432-017-9290-4 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/chinaf>
rdfs:label Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guihai_Yan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jing_Ye_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaowei_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ying_Wang_0001>
swrc:number 11 (xsd:string)
swrc:pages 112102:1-112102:17 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/chinaf/0001YY018/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/chinaf/0001YY018>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/chinaf/chinaf61.html#0001YY018>
rdfs:seeAlso <https://doi.org/10.1007/s11432-017-9290-4>
dc:title Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 61 (xsd:string)