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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/chinaf/HuangCC16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianjun_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pengcheng_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuming_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs11432-015-5471-y>
foaf:homepage <https://doi.org/10.1007/s11432-015-5471-y>
dc:identifier DBLP journals/chinaf/HuangCC16 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs11432-015-5471-y (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/chinaf>
rdfs:label Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianjun_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pengcheng_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuming_Chen>
swrc:number 4 (xsd:string)
swrc:pages 042411:1-042411:8 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/chinaf/HuangCC16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/chinaf/HuangCC16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/chinaf/chinaf59.html#HuangCC16>
rdfs:seeAlso <https://doi.org/10.1007/s11432-015-5471-y>
dc:title Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 59 (xsd:string)