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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/chinaf/QiaoPYMWX14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fengying_Qiao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haozhi_Ma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liyang_Pan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiao_Yu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs11432-013-4982-7>
foaf:homepage <https://doi.org/10.1007/s11432-013-4982-7>
dc:identifier DBLP journals/chinaf/QiaoPYMWX14 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs11432-013-4982-7 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/chinaf>
rdfs:label Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fengying_Qiao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haozhi_Ma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liyang_Pan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiao_Yu>
swrc:number 6 (xsd:string)
swrc:pages 1-9 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/chinaf/QiaoPYMWX14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/chinaf/QiaoPYMWX14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/chinaf/chinaf57.html#QiaoPYMWX14>
rdfs:seeAlso <https://doi.org/10.1007/s11432-013-4982-7>
dc:title Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 57 (xsd:string)