[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/chinaf/WongDC22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hei_Wong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shurong_Dong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zehua_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs11432-020-3197-8>
foaf:homepage <https://doi.org/10.1007/s11432-020-3197-8>
dc:identifier DBLP journals/chinaf/WongDC22 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs11432-020-3197-8 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/chinaf>
rdfs:label Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hei_Wong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shurong_Dong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zehua_Chen>
swrc:number 2 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/chinaf/WongDC22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/chinaf/WongDC22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/chinaf/chinaf65.html#WongDC22>
rdfs:seeAlso <https://doi.org/10.1007/s11432-020-3197-8>
dc:title Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 65 (xsd:string)