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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/chinaf/YuCLY15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Changchun_Chai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xinhai_Yu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yang_Liu_0106>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yintang_Yang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs11432-015-5323-9>
foaf:homepage <https://doi.org/10.1007/s11432-015-5323-9>
dc:identifier DBLP journals/chinaf/YuCLY15 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs11432-015-5323-9 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/chinaf>
rdfs:label Modeling and understanding of the frequency dependent HPM upset susceptibility of the CMOS inverter. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Changchun_Chai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xinhai_Yu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yang_Liu_0106>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yintang_Yang>
swrc:number 8 (xsd:string)
swrc:pages 1-11 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/chinaf/YuCLY15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/chinaf/YuCLY15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/chinaf/chinaf58.html#YuCLY15>
rdfs:seeAlso <https://doi.org/10.1007/s11432-015-5323-9>
dc:title Modeling and understanding of the frequency dependent HPM upset susceptibility of the CMOS inverter. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 58 (xsd:string)