Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/cin/XiongTY16
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/cin/XiongTY16
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chenglin_Yang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jian_Xiong_0003
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shulin_Tian
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1155%2F2016%2F7657054
>
foaf:
homepage
<
https://doi.org/10.1155/2016/7657054
>
dc:
identifier
DBLP journals/cin/XiongTY16
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1155%2F2016%2F7657054
(xsd:string)
dcterms:
issued
2016
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/cin
>
rdfs:
label
Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chenglin_Yang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jian_Xiong_0003
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shulin_Tian
>
swrc:
pages
7657054:1-7657054:9
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/cin/XiongTY16/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/cin/XiongTY16
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/cin/cin2016.html#XiongTY16
>
rdfs:
seeAlso
<
https://doi.org/10.1155/2016/7657054
>
dc:
title
Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
2016
(xsd:string)