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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/cm/BensoCNPB03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alfredo_Benso>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giorgio_Di_Natale>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Monica_Lobetti_Bodoni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paolo_Prinetto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefano_Di_Carlo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMCOM.2003.1232242>
foaf:homepage <https://doi.org/10.1109/MCOM.2003.1232242>
dc:identifier DBLP journals/cm/BensoCNPB03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMCOM.2003.1232242 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/cm>
rdfs:label Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alfredo_Benso>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giorgio_Di_Natale>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Monica_Lobetti_Bodoni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paolo_Prinetto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefano_Di_Carlo>
swrc:number 9 (xsd:string)
swrc:pages 90-97 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/cm/BensoCNPB03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/cm/BensoCNPB03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/cm/cm41.html#BensoCNPB03>
rdfs:seeAlso <https://doi.org/10.1109/MCOM.2003.1232242>
dc:title Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 41 (xsd:string)