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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/cma/MizutaniNIS06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroaki_Sandoh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kodo_Ito>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Mizutani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshio_Nakagawa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.camwa.2005.11.025>
foaf:homepage <https://doi.org/10.1016/j.camwa.2005.11.025>
dc:identifier DBLP journals/cma/MizutaniNIS06 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.camwa.2005.11.025 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/cma>
rdfs:label Optimal periodic testing policy for circuit with self-testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroaki_Sandoh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kodo_Ito>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Mizutani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshio_Nakagawa>
swrc:number 2 (xsd:string)
swrc:pages 363-370 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/cma/MizutaniNIS06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/cma/MizutaniNIS06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/cma/cma51.html#MizutaniNIS06>
rdfs:seeAlso <https://doi.org/10.1016/j.camwa.2005.11.025>
dc:title Optimal periodic testing policy for circuit with self-testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 51 (xsd:string)