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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/corr/JiLYGDVVCSBJSBK15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brian_L._Ji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._Johnson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dmitry_Veksler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Chong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Stamper>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Piccirillo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Liehr>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Passaro>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Rodgers>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Smalley>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Q._Ye>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Bennett>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Deora>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Gausepohl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Vivekanand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._Burroughs>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V._Kaushik>
foaf:homepage <http://arxiv.org/abs/1509.00070>
dc:identifier DBLP journals/corr/JiLYGDVVCSBJSBK15 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/corr>
rdfs:label In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brian_L._Ji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._Johnson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dmitry_Veksler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Chong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Stamper>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Piccirillo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Liehr>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Passaro>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Rodgers>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Smalley>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Q._Ye>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Bennett>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Deora>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Gausepohl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Vivekanand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/T._Burroughs>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V._Kaushik>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/corr/JiLYGDVVCSBJSBK15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/corr/JiLYGDVVCSBJSBK15>
rdfs:seeAlso <http://arxiv.org/abs/1509.00070>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/corr/corr1509.html#JiLYGDVVCSBJSBK15>
dc:title In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume abs/1509.00070 (xsd:string)