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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/corr/abs-2105-14298>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baolei_Hou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dingding_Wang_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kui_Ren_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lei_Wu_0012>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Muhui_Jiang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rui_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiapu_Luo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yajin_Zhou>
foaf:homepage <https://arxiv.org/abs/2105.14298>
dc:identifier DBLP journals/corr/abs-2105-14298 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/corr>
rdfs:label A Measurement Study on the (In)security of End-of-Life (EoL) Embedded Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baolei_Hou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dingding_Wang_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kui_Ren_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lei_Wu_0012>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Muhui_Jiang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rui_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiapu_Luo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yajin_Zhou>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/corr/abs-2105-14298/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/corr/abs-2105-14298>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/corr/corr2105.html#abs-2105-14298>
rdfs:seeAlso <https://arxiv.org/abs/2105.14298>
dc:title A Measurement Study on the (In)security of End-of-Life (EoL) Embedded Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume abs/2105.14298 (xsd:string)