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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/corr/abs-2112-15176>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antonino_La_Magna>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giovanna_Franchino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Deretzis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michelangelo_Grosso>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nunzio_Mirabella>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Salvatore_Rinaudo>
foaf:homepage <https://arxiv.org/abs/2112.15176>
dc:identifier DBLP journals/corr/abs-2112-15176 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/corr>
rdfs:label Comparing different solutions for testing resistive defects in low-power SRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antonino_La_Magna>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giovanna_Franchino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Deretzis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michelangelo_Grosso>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nunzio_Mirabella>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Salvatore_Rinaudo>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/corr/abs-2112-15176/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/corr/abs-2112-15176>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/corr/corr2112.html#abs-2112-15176>
rdfs:seeAlso <https://arxiv.org/abs/2112.15176>
dc:title Comparing different solutions for testing resistive defects in low-power SRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume abs/2112.15176 (xsd:string)