[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/corr/abs-2308-07180>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bappaditya_Dey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bartel_Van_Waeyenberge>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Enrique_Dehaerne>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandip_Halder>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_De_Gendt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vic_De_Ridder>
foaf:homepage <http://dx.doi.org/doi.org%2F10.48550%2FarXiv.2308.07180>
foaf:homepage <https://doi.org/10.48550/arXiv.2308.07180>
dc:identifier DBLP journals/corr/abs-2308-07180 (xsd:string)
dc:identifier DOI doi.org%2F10.48550%2FarXiv.2308.07180 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/corr>
rdfs:label SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bappaditya_Dey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bartel_Van_Waeyenberge>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Enrique_Dehaerne>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandip_Halder>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_De_Gendt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vic_De_Ridder>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/corr/abs-2308-07180/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/corr/abs-2308-07180>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/corr/corr2308.html#abs-2308-07180>
rdfs:seeAlso <https://doi.org/10.48550/arXiv.2308.07180>
dc:title SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume abs/2308.07180 (xsd:string)